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"Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization Recent Developments" ed. by Samir Kumar et al.

Posted By: exLib
Date: 10 Jan 2022 22:53:43
"Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization Recent Developments" ed. by Samir Kumar et al.

"Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization Recent Developments" ed. by Chandra Shakher Pathak, Samir Kumar
ITexLi | 2022 | ISBN: 1839682302 9781839682308 1839682299 9781839682292 1839682310 9781839682315 | 250 pages | PDF | 30 MB

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials.
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