"Atomic Force Microscopy: Imaging, Measuring and Manipulating Surfaces at the Atomic Scale" ed. by Victor Bellitto
"Atomic Force Microscopy: Imaging, Measuring and Manipulating Surfaces at the Atomic Scale" ed. by Victor Bellitto
InTeOpP | 2012 | ISBN: 9535104144 9789535104148 | 267 pages | PDF | 21 MB
InTeOpP | 2012 | ISBN: 9535104144 9789535104148 | 267 pages | PDF | 21 MB
This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields.
Contents
Preface
Chapter 1 Crystal Lattice Imaging Using Atomic Force Microscopy
Chapter 2 Atomic Force Microscopy in Optical Imaging and Characterization
Chapter 3 Magnetic Force Microscopy: Basic Principles and Applications
Chapter 4 Vibration Responses of Atomic Force Microscope Cantilevers
Chapter 5 Wavelet Transforms in Dynamic Atomic Force Spectroscopy
Chapter 6 Nanoscale Effects of Friction, Adhesion and Electrical Conduction in AFM Experiments
Chapter 7 Measurement of the Nanoscale Roughness by Atomic Force Microscopy: Basic Principles and Applications
Chapter 8 Predicting Macroscale Effects Through Nanoscale Features
Chapter 9 AFM Application in III-Nitride Materials and Devices
Chapter 10 Atomic Force Microscopy to Characterize the Healing Potential of Asphaltic Materials
Chapter 11 Atomic Force Microscopy - For Investigating Surface Treatment of Textile Fibers
with TOC BookMarkLinks