PIXE: A Novel Technique for Elemental Analysis
Sven A. E. Johansson, John L. Campbell, "PIXE: A Novel Technique for Elemental Analysis"
1988 | ISBN-10: 0471920118 | 360 pages | PDF | 6 MB
1988 | ISBN-10: 0471920118 | 360 pages | PDF | 6 MB
The first comprehensive review of the basic physics, and modern applications, of proton-induced x-ray emission. The physics section and the applications section are relatively independent, making for easy reference. The authors discuss instrument design, and how to handle specimens. They then survey the wide range of applications to which proton-induced x-ray emission has been put. Illustrated.