Silicon Nanoelectronics (Optical Science and Engineering) by Shunri Oda
CRC Press; 1 edition | June 27, 2005 | English | ISBN: 0824726332 | 309 pages | PDF | 10 MB
CRC Press; 1 edition | June 27, 2005 | English | ISBN: 0824726332 | 309 pages | PDF | 10 MB
Technological advancement in chip development, primarily based on the downscaling of the feature size of transistors, is threatening to come to a standstill as we approach the limits of conventional scaling. For example, when the number of electrons in a device's active region is reduced to less than ten electrons (or holes), quantum fluctuation errors will occur, and when gate insulator thickness becomes too insignificant to block quantum mechanical tunneling, unacceptable leakage will occur.