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Design, Analysis and Test of Logic Circuits Under Uncertainty [Repost]
![Design, Analysis and Test of Logic Circuits Under Uncertainty [Repost]](https://pixhost.icu/avaxhome/27/c0/0036c027.jpeg)
Igor L. Markov, John P. Hayes - Design, Analysis and Test of Logic Circuits Under Uncertainty
Published: 2012-09-21 | ISBN: 9048196434, 9400797982 | PDF | 124 pages | 3.35 MB
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design–-one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.