Wayne B. Nelson - Accelerated Testing: Statistical Models, Test Plans, and Data Analysis
Published: 2004-09-21 | ISBN: 0471697362 | PDF | 624 pages | 31 MB
A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source.