Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis (repost)
Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis by Nobuo Tanaka
English | 2014 | ISBN: 184816789X | ISBN-13: 9781848167896 | 400 pages | PDF | 34,7 MB
English | 2014 | ISBN: 184816789X | ISBN-13: 9781848167896 | 400 pages | PDF | 34,7 MB
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students.
This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.